Title :
Multi-photon excitation fluorescence lifetime imaging
Author :
Gerritsen, H. ; de Grauw, K.
Author_Institution :
Debye Res. Inst., Utrecht Univ., Netherlands
Abstract :
Summary form only given. Multi-photon excitation microscopy (MPEM) offers several advantages over conventional confocal imaging. One of these advantages is the improved in-depth imaging performance that is due to the comparatively long excitation wavelength and the reduced photo damage to the sample. Using fluorescence lifetime imaging (FLIM) the potential of MPEM can be further extended. This combination turns out to be particularly useful for quantitative imaging in thick specimens. The pulsed light source required for MPEM makes the implementation of FLIM in MPE microscopes simple. We employ a simple time-gating scheme. The FLIM module exists of 8 computer controlled gated photon counters. Each gate is opened sequentially after an excitation pulse. This makes the method very efficient and comparatively insensitive to photobleaching effects. Comparisons with time-correlated single photon counting measurements show that accurate results can be obtained for fluorescence decay times greater than 0.5 ns. FLIM can be employed for the quantitative imaging of ion-concentrations and offers several advantages compared with conventional methods such as emission- and excitation-ratio imaging. We present results of pH imaging in thick dental biofilm.
Keywords :
biological techniques; fluorescence; multiphoton processes; optical images; optical microscopy; photon counting; radiative lifetimes; fluorescence decay times; fluorescence lifetime imaging; gated photon counters; improved in-depth imaging; ion-concentrations; multiphoton excitation microscopy; pH imaging; pulsed light source; quantitative imaging; reduced photo damage; thick dental biofilm; Counting circuits; Dentistry; Fluorescence; Light scattering; Microscopy; Optical computing; Optical control; Particle scattering; Probes; Sugar;
Conference_Titel :
Quantum Electronics Conference, 2000. Conference Digest. 2000 International
Conference_Location :
Nice, France
Print_ISBN :
0-7803-6318-3
DOI :
10.1109/IQEC.2000.908161