• DocumentCode
    2942466
  • Title

    Laser source independent basic parameters — Focus position, pulse overlap, track overlap — In laser micro milling using as rapid manufacturing process

  • Author

    Kagerer, Markus ; Irlinger, Franz ; Lueth, Tim C.

  • Author_Institution
    Inst. of Micro Technol. & Med. Device Technol., Tech. Univ. Munchen, München, Germany
  • fYear
    2012
  • fDate
    11-14 July 2012
  • Firstpage
    135
  • Lastpage
    140
  • Abstract
    Laser micro machining belongs to the most important processes in rapid prototyping / rapid manufacturing. Especially Nd:YAG lasers with a galvanometer scanner are extremely common in manufacturing Micro-Electro-Mechanical-Systems (MEMS) in a time and cost saving manner. Moreover, laser micro milling is one of the most significant processes in laser micro machining apart from laser micro cutting and micro welding. In recent years a lot of investigations were done for direct parameters of the laser source such as the laser power, the fluence, the repetition rate, the lamp current, and the pulse duration. These parameters are not applicable to other laser systems because they are depending on the used laser source. The basic parameters (focus position, pulse overlap, track overlap), which are completely independent of the used laser sources, were mostly neglected although they have a huge influence on the result of the process. Therefore, this project investigates laser micro milling square pockets in silicon with a nanosecond Nd:YAG IR laser. For each basic parameter the ablation rate, the surface roughness as well as the machining diameter are determined.
  • Keywords
    galvanometers; laser beam cutting; laser beam machining; laser beam welding; micromachining; micromechanical devices; milling; production engineering computing; rapid prototyping (industrial); surface roughness; MEMS manufacturing; Nd:YAG; galvanometer scanner; laser focus position; laser microcutting; laser micromachining; laser micromilling; laser microwelding; laser pulse overlap; laser source independent basic parameters; laser track overlap; microelectromechanical systems manufacturing; rapid manufacturing process; rapid prototyping; surface roughness; Laser ablation; Laser beam cutting; Laser beams; Milling; Rough surfaces; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Intelligent Mechatronics (AIM), 2012 IEEE/ASME International Conference on
  • Conference_Location
    Kachsiung
  • ISSN
    2159-6247
  • Print_ISBN
    978-1-4673-2575-2
  • Type

    conf

  • DOI
    10.1109/AIM.2012.6265899
  • Filename
    6265899