• DocumentCode
    2942498
  • Title

    Effects of thermal and radiation stresses on elastomer properties

  • Author

    Clavreul, R.

  • Author_Institution
    Electr. de France, Moret-sur-Loing, France
  • Volume
    2
  • fYear
    1997
  • fDate
    19-22, Oct 1997
  • Firstpage
    414
  • Abstract
    Ethylene Propylene Copolymer and Silicone are used as joints in electrical materials in nuclear power plants in France. In order to determine the elastomer service lifetime in normal and accidental conditions, we have studied the effects of thermal and radiation stresses applied to these materials. After accelerated aging tests, the mechanical properties such as elongation at break and tensile strength allowed us to appreciate the material service lifetime according to IEC 544-2. The lifetime prediction of Ethylene Propylene Copolymer and Silicone in normal conditions was estimated by applying a kinetic model where the constant depends on the Arrhenius law for thermal aging and the dose rate for radiation aging
  • Keywords
    ageing; elongation; ethylene-propylene rubber; gamma-ray effects; insulation testing; life testing; polymer blends; silicone rubber; tensile strength; thermal stresses; Arrhenius law; IEC 544-2; accelerated aging tests; accidental conditions; dose rate; elastomer properties; elastomer service lifetime; electrical materials; elongation; ethylene propylene copolymer; gamma radiation; joints; kinetic model; mechanical properties; normal conditions; nuclear power plants; radiation aging; radiation stresses; silicone; tensile strength; thermal aging; thermal stresses; Accelerated aging; IEC standards; Joining materials; Life estimation; Life testing; Materials testing; Mechanical factors; Power generation; Tensile stress; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1997. IEEE 1997 Annual Report., Conference on
  • Conference_Location
    Minneapolis, MN
  • Print_ISBN
    0-7803-3851-0
  • Type

    conf

  • DOI
    10.1109/CEIDP.1997.641099
  • Filename
    641099