Title :
Design consideration for folding/interpolation ADC with SiGe HBT
Author :
Kobayashi, Haruo ; Mizuta, Toshiya ; Uchida, Kenji ; Matsuura, Hiroyuki ; Miura, Akira ; Yakihara, Tsuyoshi ; Oka, Sadaharu ; Murata, Daisuke
Author_Institution :
Teratec Corp., Musashino, Japan
Abstract :
This paper describes the design and performance of a high-speed 6-bit ADC using SiGe HBT for measuring-instrument applications. We show that the Gummel-Poon model suffices for SiGe HBT modeling and then we describe that the folding/interpolation architecture as well as simple, differential circuit design are suitable for ADC design with SiGe HBT. Measured results show that the nonlinearity of the ADC is within ±1/2 LSB, and the effective bits are 5.2 bits at an input frequency of 100 MHz and 4.2 bits at 200 MHz with 768 MS/s. We also describe some design issues for folding/interpolation ADC
Keywords :
analogue-digital conversion; heterojunction bipolar transistors; interpolation; network synthesis; semiconductor device models; semiconductor heterojunctions; 100 MHz; 200 MHz; ADC design; Gummel-Poon model; SiGe; SiGe HBT; differential circuit design; folding/interpolation ADC; heterojunction bipolar transistors; measuring-instrument; nonlinearity; CMOS technology; Circuits; Costs; Gallium arsenide; Germanium silicon alloys; Heterojunction bipolar transistors; Interpolation; MESFETs; Silicon germanium; Thin film transistors;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1997. IMTC/97. Proceedings. Sensing, Processing, Networking., IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-3747-6
DOI :
10.1109/IMTC.1997.612379
