Design consideration for folding/interpolation ADC with SiGe HBT

Author

Kobayashi, Haruo ; Mizuta, Toshiya ; Uchida, Kenji ; Matsuura, Hiroyuki ; Miura, Akira ; Yakihara, Tsuyoshi ; Oka, Sadaharu ; Murata, Daisuke

Author_Institution

Teratec Corp., Musashino, Japan

Volume

2

fYear

1997

fDate

19-21 May 1997

Firstpage

1142

Abstract

This paper describes the design and performance of a high-speed 6-bit ADC using SiGe HBT for measuring-instrument applications. We show that the Gummel-Poon model suffices for SiGe HBT modeling and then we describe that the folding/interpolation architecture as well as simple, differential circuit design are suitable for ADC design with SiGe HBT. Measured results show that the nonlinearity of the ADC is within ±1/2 LSB, and the effective bits are 5.2 bits at an input frequency of 100 MHz and 4.2 bits at 200 MHz with 768 MS/s. We also describe some design issues for folding/interpolation ADC

Keywords

analogue-digital conversion; heterojunction bipolar transistors; interpolation; network synthesis; semiconductor device models; semiconductor heterojunctions; 100 MHz; 200 MHz; ADC design; Gummel-Poon model; SiGe; SiGe HBT; differential circuit design; folding/interpolation ADC; heterojunction bipolar transistors; measuring-instrument; nonlinearity; CMOS technology; Circuits; Costs; Gallium arsenide; Germanium silicon alloys; Heterojunction bipolar transistors; Interpolation; MESFETs; Silicon germanium; Thin film transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1997. IMTC/97. Proceedings. Sensing, Processing, Networking., IEEE

Conference_Location

Ottawa, Ont.

ISSN

1091-5281

Print_ISBN

0-7803-3747-6

Type

conf

DOI

10.1109/IMTC.1997.612379

Filename

612379