DocumentCode
2942694
Title
System of Measuring the Sub-Pixel Edge of CCD Image´s
Author
Wang, Yu Mei ; Xu, Guo Sheng
Author_Institution
Weifang Univ., Weifang, China
fYear
2010
fDate
19-21 June 2010
Firstpage
1
Lastpage
4
Abstract
In order to improve the precision, speed, integration and reliability of the linear CCD system, which was used to detect the sub-pixel edge of picture, a new digital system based on auto focusing was designed. The system captures the image of the tested work piece through a CCD, puts the image data into computer, gathers coordinate of tested edge of work by the method of digital image processing and auto focusing. The data of signals memorized in computer were processed by using software system of data collecting. Thereby, the inspection of precise size and location of defects were achieved. The result shows that The resolving power of this method can reach 20 μm and the error is less than 10%.The possibility that the impurity particles can be checked out is up to 100%.
Keywords
CCD image sensors; edge detection; auto focusing; data collection; digital image processing; edge detection; linear CCD system; Charge coupled devices; Digital images; Digital systems; Focusing; Image edge detection; Inspection; Signal processing; Signal resolution; Software systems; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Photonics and Optoelectronic (SOPO), 2010 Symposium on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-4963-7
Electronic_ISBN
978-1-4244-4964-4
Type
conf
DOI
10.1109/SOPO.2010.5504485
Filename
5504485
Link To Document