DocumentCode
2943284
Title
The compound resonator approach : Parity control and selectivity enhancement in N-resonator planar systems
Author
Caillet, T. ; Bajon, D. ; Wane, S. ; Plana, R.
Author_Institution
Universite de Toulouse ISAE-SUPAERO, France
fYear
2008
fDate
15-20 June 2008
Firstpage
1015
Lastpage
1018
Abstract
The compound resonator approach considers a N-Resonator System (N-RS) as a single entity which exhibits N resonance modes. This approach extends to resonator systems the eigen-mode analysis applied to multiconductor transmission-lines as an attempt to bring together Electromagnetic (EM) and circuit representations in the analysis of N-Resonator Systems. Incorporating the loss effects and the control of the topological sensitivity in N-RS analysis is of prior importance to enhance the system selectivity. In this prospect, a concept of enabled/disabled state herein referenced as N-RSoff and N-RSon systems is introduced. 30 dB rejection level improvement is experimentally demonstrated around 2 GHz combined with a spurious level less than 20 dB up to 12 GHz with a compact topology on a very low cost technology. The proposed approach also suggests systematic methodologies to draw potentialities of emergent technologies in terms of assessment factors including selectivity based on efficient use of EM simulations during synthesis process.
Keywords
eigenvalues and eigenfunctions; resonators; N-resonator planar systems; circuit representations; compound resonator; eigen-mode analysis; electromagnetic representations; frequency 12 GHz; multiconductor transmission-lines; parity control; selectivity enhancement; Circuit simulation; Circuit synthesis; Circuit topology; Control systems; Costs; Electromagnetic analysis; Q factor; Resonance; Transmission line matrix methods; Transmission lines; Q factor; eigen-state; meander line; resonator system; selectivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location
Atlanta, GA
ISSN
0149-645X
Print_ISBN
978-1-4244-1780-3
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2008.4633007
Filename
4633007
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