• DocumentCode
    2943284
  • Title

    The compound resonator approach : Parity control and selectivity enhancement in N-resonator planar systems

  • Author

    Caillet, T. ; Bajon, D. ; Wane, S. ; Plana, R.

  • Author_Institution
    Universite de Toulouse ISAE-SUPAERO, France
  • fYear
    2008
  • fDate
    15-20 June 2008
  • Firstpage
    1015
  • Lastpage
    1018
  • Abstract
    The compound resonator approach considers a N-Resonator System (N-RS) as a single entity which exhibits N resonance modes. This approach extends to resonator systems the eigen-mode analysis applied to multiconductor transmission-lines as an attempt to bring together Electromagnetic (EM) and circuit representations in the analysis of N-Resonator Systems. Incorporating the loss effects and the control of the topological sensitivity in N-RS analysis is of prior importance to enhance the system selectivity. In this prospect, a concept of enabled/disabled state herein referenced as N-RSoff and N-RSon systems is introduced. 30 dB rejection level improvement is experimentally demonstrated around 2 GHz combined with a spurious level less than 20 dB up to 12 GHz with a compact topology on a very low cost technology. The proposed approach also suggests systematic methodologies to draw potentialities of emergent technologies in terms of assessment factors including selectivity based on efficient use of EM simulations during synthesis process.
  • Keywords
    eigenvalues and eigenfunctions; resonators; N-resonator planar systems; circuit representations; compound resonator; eigen-mode analysis; electromagnetic representations; frequency 12 GHz; multiconductor transmission-lines; parity control; selectivity enhancement; Circuit simulation; Circuit synthesis; Circuit topology; Control systems; Costs; Electromagnetic analysis; Q factor; Resonance; Transmission line matrix methods; Transmission lines; Q factor; eigen-state; meander line; resonator system; selectivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2008 IEEE MTT-S International
  • Conference_Location
    Atlanta, GA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-1780-3
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2008.4633007
  • Filename
    4633007