Title :
An efficient subcircuit extraction algorithm by resource management
Author :
Ling, Tang ; Yun, David Y Y
Author_Institution :
Dept. of Electr. Eng., Hawaii Univ., Honolulu, HI, USA
Abstract :
To find subcircuits in a larger electronic circuit continues to be important in the test of VLSI computer-aided design and IC fabrication or verification. In this paper, an efficient approach to solve the subgraph isomorphism problem based on the resource management paradigm is transformed to extract subcircuits. By integrating several effective planning strategies with the concept of centered spanning tree for circuit decomposition and partition, the proposed approach minimizes the number of backtracks and eliminates the nonisomorphic subcircuits early during the tree and cotree matching process, so that the time wasted on unsuccessful matching is dramatically reduced. Thus, an average-case, near-linear time performance is achieved, even in cases where the circuit size is very large and the circuit structure is highly symmetric. Also, due to the graphic representation of circuits with preservation of the topological structure information, the shorted input circuits which are intractable to SubGemini can be recognized without difficulty
Keywords :
VLSI; application specific integrated circuits; circuit layout CAD; design for testability; graph theory; integrated circuit layout; resource allocation; ASIC design; DFT strategy; IC verification; VLSI design; centered spanning tree; circuit decomposition; circuit partition; computer-aided design; planning strategies; resource management; shorted input circuits; subcircuit extraction algorithm; subgraph isomorphism problem; topological structure information; Circuit testing; Design automation; Electronic circuits; Electronic equipment testing; Fabrication; Integrated circuit testing; Process planning; Resource management; Strategic planning; Very large scale integration;
Conference_Titel :
ASIC, 1996., 2nd International Conference on
Conference_Location :
Shanghai
Print_ISBN :
7-5439-0940-5
DOI :
10.1109/ICASIC.1996.562738