Title :
Variable Temperature Scanning Hall Probe Microscopy (SHPM) Using Quartz Crystal AFM Feedback
Author :
Dede, M. ; Urkmen, K. ; Oral, A. ; Farrer, I. ; Ritchie, D.A.
Author_Institution :
Bilkent Univ., Ankara
Abstract :
Scanning Hall Probe Microscopy (SHPM) is a quantitative and non-invasive technique for imaging localized surface magnetic field fluctuations such as ferromagnetic domains. In this work, we have eliminated the difficulty in the cantilever-Hall probe integration process, just by gluing a Hall Probe chip to a quartz crystal tuning fork force sensor. The resultant SHPM can operate in variable temperature environment, 77-300 K.
Keywords :
Hall effect; atomic force microscopy; cantilevers; magnetic variables measurement; scanning probe microscopy; AFM feedback; atomic force microscopy; cantilever-Hall probe integration; quartz crystal; scanning Hall probe microscopy; temperature 77 K to 300 K; tuning fork force sensor; Atomic force microscopy; Feedback; Fluctuations; Force sensors; Hall effect devices; Magnetic fields; Magnetic force microscopy; Probes; Temperature; Vibrations;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.376308
