Modeling device manufacturing uncertainty in Electromagnetic Simulations

This work presents a technique for modeling of the effects of manufacturing uncertainty into electromagnetic simulations of microwave devices. The procedure combines the unscented transform (UT) with EM simulations. The use of the UT allows efficient use of computational resources for the characterization of the random variables modeling the uncertainty. The technique is validated with the modeling of tolerance errors of an assembled microstrip pseudo-elliptic filter into the response of the electromagnetic simulation.