DocumentCode
2943885
Title
Update of the EPSON method for PFC measurement using FT-IR
Author
Namose, Isamu
Author_Institution
Seiko Epson Corp., Fujimi
fYear
2007
fDate
15-17 Oct. 2007
Firstpage
1
Lastpage
4
Abstract
In this paper, the update of the EPSON method is described for PFC measurement using FT-IR. The previous version of the EPSON method can not cover the measurement for higher concentration exhaust, due to the IR absorption saturation. The IR absorption depends on the pressure. The reduction of pressure can make high concentration measurement easier. This technique is useful for the gases which are easy to saturate for its absorbance. The EPSON Method has been updated, and provides wide concentration range measurement without increased difficulty in the test procedure or expense.
Keywords
Fourier transform spectra; chemical variables measurement; infrared spectra; pollution measurement; spectrochemical analysis; EPSON method; FT-IR measurement; IR absorption; concentration measurement; perfluoro compounds measurement; pressure reduction; Electromagnetic wave absorption; Equations; Gases; Guidelines; Infrared spectra; Nitrogen; Pressure measurement; Protocols; Sulfur hexafluoride; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing, 2007. ISSM 2007. International Symposium on
Conference_Location
Santa Clara, CA
ISSN
1523-553X
Print_ISBN
978-1-4244-1142-9
Electronic_ISBN
1523-553X
Type
conf
DOI
10.1109/ISSM.2007.4446792
Filename
4446792
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