DocumentCode
2944033
Title
900 V DMOS and 1100 V UMOS 4H-SiC power FETs
Author
Casady, J.B. ; Agarwal, A.K. ; Rowland, L.B. ; Valek, W.F. ; Brandt, C.D.
Author_Institution
Northrop Grumman Sci. & Technol. Center, Pittsburgh, PA, USA
fYear
1997
fDate
23-25 June 1997
Firstpage
32
Lastpage
33
Abstract
While the advantages of SiC power MOSFETs (both UMOS and DMOS type structures) are known, processing issues have prevented these devices from reaching commercial systems. We evaluate the 4H-SiC DMOS (DIMOS) structure and the 4H-SiC UMOS structure using experimental results. We have achieved 1.1 kV SiC UMOS devices and 900 V SiC DMOS devices, which represent the highest reported blocking voltages for both devices to date.
Keywords
characteristics measurement; electric strength; power MOSFET; semiconductor materials; silicon compounds; wide band gap semiconductors; 1.1 kV; 900 V; DIMOS; DMOS power FETs; SiC; UMOS power FETs; blocking voltages; processing issues; Electric breakdown; Electrical resistance measurement; FETs; Implants; MOSFETs; Silicon carbide; Temperature dependence; Temperature measurement; Thermal conductivity; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference Digest, 1997. 5th
Conference_Location
Fort Collins, CO, USA
Print_ISBN
0-7803-3911-8
Type
conf
DOI
10.1109/DRC.1997.612463
Filename
612463
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