Title :
Planar Er waveguide amplifier with 8-mW threshold
Author :
Shmulovich, J. ; Ghosh, Ruby N. ; Kane, C.F. ; deBarros, M.R.X. ; Nykolak, G. ; Bruce, A.J. ; Gates, J.V.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
fDate :
25 Feb.-1 March 1996
Abstract :
Summary form only given. In previous papers, we reported on waveguide amplifiers fabricated from Er3+)-doped sodalime glass films on oxidized silicon wafers. In this work we report on waveguide amplifiers with a lower Er concentration and fabricated via an improved processing technique, which allows the lowest threshold of any waveguide amplifier reported to date.
Keywords :
erbium; optical communication equipment; optical fabrication; optical films; optical planar waveguides; solid lasers; waveguide lasers; 8 mW; Er concentration; Er3+)-doped sodalime glass films; mW threshold; optical planar waveguide laser amplifiers; oxidized silicon wafers; planar Er waveguide amplifier; Erbium; Frequency measurement; Optical amplifiers; Optical filters; Optical waveguides; Phase measurement; Planar waveguides; Spectral analysis; Switches; Wavelength measurement;
Conference_Titel :
Optical Fiber Communications, 1996. OFC '96
Print_ISBN :
1-55752-422-X
DOI :
10.1109/OFC.1996.908269
