DocumentCode
2944286
Title
An approach of dynamic bottleneck machine dispatching for semiconductor wafer fab
Author
Huai, Zhang ; Zhibin, Jiang ; Yen-Fei, Lee ; Chen-Pin, Ko ; Tuck, Luke Choo Ooi ; Phing, Lim Lee
Author_Institution
Shanghai Jiao Tong Univ., Shanghai
fYear
2007
fDate
15-17 Oct. 2007
Firstpage
1
Lastpage
4
Abstract
This paper proposed a dynamic bottleneck dispatching (DBD) policy to consider the dynamic bottlenecks for semiconductor wafer fabrication system. The DBD policy adopted the multi-class priority queuing model and developed a procedure to assign lots to different priority classes. Each queuing lot was assigned to a priority class by 3 decision parameters, which could be optimized by the response surface method and a desirability function approach. A case study based on a local fab was described to examine the performance impact of the DBD policy measured by CT, Var CT, WIP, and TP. The results of the simulation experiments and analysis showed that the DBD policy is superior to the use of the static dispatching rules. In future work, the DBD policy could be integrated with manufacturing execution system (MES) for scheduling wafer fab.
Keywords
dispatching; integrated circuit manufacture; manufacturing processes; semiconductor device manufacture; desirability function approach; dynamic bottleneck machine dispatching; multi-class priority queuing model; response surface method; semiconductor manufacturing process; semiconductor wafer fabrication; Analytical models; Dispatching; Fabrication; Job shop scheduling; Manufacturing; Optimization methods; Performance analysis; Reactive power; Response surface methodology; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing, 2007. ISSM 2007. International Symposium on
Conference_Location
Santa Clara, CA
ISSN
1523-553X
Print_ISBN
978-1-4244-1142-9
Electronic_ISBN
1523-553X
Type
conf
DOI
10.1109/ISSM.2007.4446814
Filename
4446814
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