• DocumentCode
    2944314
  • Title

    Correlation of Giant Magnetoresistance with Infrared Magnetorefractive Spectra

  • Author

    Mennicke, R.T. ; Matthew, J.D. ; Thompson, S.M.

  • Author_Institution
    Univ. of York, York
  • fYear
    2006
  • fDate
    8-12 May 2006
  • Firstpage
    617
  • Lastpage
    617
  • Abstract
    In this paper contactless measurements of magnetoresistance (MR) using electromagnetic radiation are attractive for in-situ probing of MR. The magnetorefractive effect (MRE) relates the MR to reflection in the far infrared (IR). An extended Drude model is used to describe the spin-dependent conduction and incorporated into the complex dielectric function. The reflectance, transmittance and emittance are determined by the complex dielectric function, hence enabling (IR) optics to sense MR. A wide variety of MR materials have now been studied using the MRE. For this technique to be useful, a simple relationship between the IR reflection and the electrical MR is required. Using CoFe/Cu multilayers, we test such a relationship as predicted by simulations. The MRE is defined as the change in the IR spectrum in a magnetic field.
  • Keywords
    Fourier transform spectra; cobalt alloys; copper alloys; dielectric function; galvanomagnetic effects; giant magnetoresistance; infrared spectra; magnetic annealing; magnetic multilayers; magneto-optical effects; CoFeCu; FT-IR spectrometer; annealing; complex dielectric function; electromagnetic radiation; extended Drude model; far infrared spectra; giant magnetoresistance; infrared magnetorefractive spectra; multilayers; temperature 0 C; temperature 200 C; temperature 300 C; temperature 400 C; temperature 450 C; Dielectric measurements; Electromagnetic measurements; Electromagnetic radiation; Electromagnetic reflection; Giant magnetoresistance; Infrared spectra; Optical reflection; Optical sensors; Reflectivity; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2006. INTERMAG 2006. IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-1479-2
  • Type

    conf

  • DOI
    10.1109/INTMAG.2006.376341
  • Filename
    4262050