• DocumentCode
    2944505
  • Title

    Characterizing the Operating Curve — how can semiconductor fabs grade themselves?

  • Author

    Fayed, Asser ; Dunnigan, Bill

  • Author_Institution
    Cypress Semicond. Inc., Bloomington
  • fYear
    2007
  • fDate
    15-17 Oct. 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Profitability in semiconductor manufacturing may depend on how successful a fab is able to set and meet throughput and cycle-time goals and on its ability to interactively manage the trade-off between these two KPI to maximize its utility. The operating curve (OC) is a popular tool to address this issue and it can be constructed using simulation or queuing analysis. However in order to drive improvements and to properly grade fabs to what they deserve, we need to understand the OC framework. We used interviews with experts, literature and queuing analysis to establish the OC framework. After adoption by our fab, we are able to see solid attainment of cycle-time and throughput goals and we are using it to drive continuous improvements.
  • Keywords
    electronics industry; flexible manufacturing systems; integrated circuit manufacture; profitability; queueing theory; semiconductor device manufacture; fab configuration; fab flexibility; fab loading; fab variability metrics; operating curve characteristics; queuing analysis; semiconductor manufacturing profitability; trade-off management; Analytical models; Costs; Economies of scale; Production; Profitability; Pulp manufacturing; Queueing analysis; Semiconductor device manufacture; Solids; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 2007. ISSM 2007. International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1523-553X
  • Print_ISBN
    978-1-4244-1142-9
  • Electronic_ISBN
    1523-553X
  • Type

    conf

  • DOI
    10.1109/ISSM.2007.4446827
  • Filename
    4446827