DocumentCode
2944521
Title
On-demand inspection recipe to detect defects of interest using Mahalanobis distance
Author
Ono, Makoto ; Konishi, Junko ; Funakoshi, Tomohiro ; Sugahara, Hitoshi
Author_Institution
Hitachi Ltd., Yokohama
fYear
2007
fDate
15-17 Oct. 2007
Firstpage
1
Lastpage
5
Abstract
An on-demand inspection recipe-setup method to detect defects of interest (DOI) was proposed. The method applies Maharanobis distance to recognize DOI-like defects without its own recipe. Moreover, actual application was evaluated and the method effectiveness was confirmed from viewpoints of on-demand processing time and DOI detection. The proposed method enables inspection tool managers to rapidly select an appropriate recipe which detects the most DOI from several initial recipes. The future research work will focus on several examinations for threshold decision based on reviewing all detected defects experimentally.
Keywords
inspection; Mahalanobis distance; defects of interest; detect defects; inspection tool managers; on-demand inspection recipe; on-demand processing time; Acceleration; Circuits; Gas detectors; Inspection; Laboratories; Manufacturing processes; Production engineering; Scanning electron microscopy; Semiconductor device manufacture; Semiconductor devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing, 2007. ISSM 2007. International Symposium on
Conference_Location
Santa Clara, CA
ISSN
1523-553X
Print_ISBN
978-1-4244-1142-9
Electronic_ISBN
1523-553X
Type
conf
DOI
10.1109/ISSM.2007.4446828
Filename
4446828
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