• DocumentCode
    2944521
  • Title

    On-demand inspection recipe to detect defects of interest using Mahalanobis distance

  • Author

    Ono, Makoto ; Konishi, Junko ; Funakoshi, Tomohiro ; Sugahara, Hitoshi

  • Author_Institution
    Hitachi Ltd., Yokohama
  • fYear
    2007
  • fDate
    15-17 Oct. 2007
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    An on-demand inspection recipe-setup method to detect defects of interest (DOI) was proposed. The method applies Maharanobis distance to recognize DOI-like defects without its own recipe. Moreover, actual application was evaluated and the method effectiveness was confirmed from viewpoints of on-demand processing time and DOI detection. The proposed method enables inspection tool managers to rapidly select an appropriate recipe which detects the most DOI from several initial recipes. The future research work will focus on several examinations for threshold decision based on reviewing all detected defects experimentally.
  • Keywords
    inspection; Mahalanobis distance; defects of interest; detect defects; inspection tool managers; on-demand inspection recipe; on-demand processing time; Acceleration; Circuits; Gas detectors; Inspection; Laboratories; Manufacturing processes; Production engineering; Scanning electron microscopy; Semiconductor device manufacture; Semiconductor devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 2007. ISSM 2007. International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1523-553X
  • Print_ISBN
    978-1-4244-1142-9
  • Electronic_ISBN
    1523-553X
  • Type

    conf

  • DOI
    10.1109/ISSM.2007.4446828
  • Filename
    4446828