Title :
Study of SET devices for metrological applications at 0.4 K
Author_Institution :
Inst. for Nat. Meas. Stand., Nat. Res. Council of Canada, Ottawa, Ont., Canada
Abstract :
Single electron effects have been observed in devices measured at temperatures as low as 0.4 K. The charge noise was measured in electrometers and evidence of background charge fluctuations was observed. Custom-made micro-coax cables have also been fabricated and their measured attenuation is found to increase with the 3/4´th power of frequency, in contrast to the 1/2 power dependence expected from the theory.
Keywords :
charge measurement; coaxial cables; cryogenic electronics; electrometers; quantum interference devices; tunnelling; 0.4 K; SET device; attenuation; background charge fluctuations; charge noise; cryogenic metrology; electrometer; micro-coax cable; power law; single electron tunneling; Attenuation measurement; Background noise; Cables; Charge measurement; Current measurement; Electrons; Fluctuations; Noise measurement; Power measurement; Temperature measurement;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.699873
