DocumentCode :
2944726
Title :
Measurement of polarized nano-material (PNM) for microwave applications
Author :
Chen, Wenhua ; Zhang, Zhijun ; Feng, Zhenghe ; Chen, Yaqin ; Jiang, Kaili ; Fan, Shoushan ; Iskander, M.
Author_Institution :
State Key Lab on Microwave&Digital Communication, Tsinghua Univ., Beijing, 100084, China
fYear :
2008
fDate :
15-20 June 2008
Firstpage :
1577
Lastpage :
1580
Abstract :
Study on a novel polarized nano-material (PNM) textile for microwave application has been carried out in this paper. Based on the PNM textile fabricated by Tsinghua-Foxconn Nanotechnology Center, we set up a waveguide test bed to evaluate different kinds of polarized PNM samples. In this paper, Crossed polarized, horizontal polarized and vertical polarized samples (all in waveguide) have been measured in the proposed test bed respectively. Experimental results show the polarization of the nanotube has dominant effect on the performance. The vertical polarized sample has the best performance in shielding effectiveness, the isolation between the two ports of the transmission waveguide is better than 15 dB in average by using 20 layers of PNM yarns, and the horizontal polarized sample is almost invisible. This experiment gives a much deeper sight on the electromagnetic shielding principle of the nanotube materials, and will advance the application of PNM materials in many fields.
Keywords :
carbon nanotubes; electromagnetic shielding; electromagnetic wave polarisation; textiles; waveguides; yarn; C; Tsinghua-Foxconn Nanotechnology Center; electromagnetic shielding; microwave application; nanotube polarization; polarized nanomaterial textile; shielding effectiveness; transmission waveguide; waveguide test bed; yarns; Carbon nanotubes; Conducting materials; Electromagnetic interference; Electromagnetic wave polarization; Electromagnetic waveguides; Microwave measurements; Nanotechnology; Organic materials; Textiles; Yarn; Carbon nanotube; polarization; shielding effectiveness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location :
Atlanta, GA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-1780-3
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2008.4633084
Filename :
4633084
Link To Document :
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