DocumentCode
2944726
Title
Measurement of polarized nano-material (PNM) for microwave applications
Author
Chen, Wenhua ; Zhang, Zhijun ; Feng, Zhenghe ; Chen, Yaqin ; Jiang, Kaili ; Fan, Shoushan ; Iskander, M.
Author_Institution
State Key Lab on Microwave&Digital Communication, Tsinghua Univ., Beijing, 100084, China
fYear
2008
fDate
15-20 June 2008
Firstpage
1577
Lastpage
1580
Abstract
Study on a novel polarized nano-material (PNM) textile for microwave application has been carried out in this paper. Based on the PNM textile fabricated by Tsinghua-Foxconn Nanotechnology Center, we set up a waveguide test bed to evaluate different kinds of polarized PNM samples. In this paper, Crossed polarized, horizontal polarized and vertical polarized samples (all in waveguide) have been measured in the proposed test bed respectively. Experimental results show the polarization of the nanotube has dominant effect on the performance. The vertical polarized sample has the best performance in shielding effectiveness, the isolation between the two ports of the transmission waveguide is better than 15 dB in average by using 20 layers of PNM yarns, and the horizontal polarized sample is almost invisible. This experiment gives a much deeper sight on the electromagnetic shielding principle of the nanotube materials, and will advance the application of PNM materials in many fields.
Keywords
carbon nanotubes; electromagnetic shielding; electromagnetic wave polarisation; textiles; waveguides; yarn; C; Tsinghua-Foxconn Nanotechnology Center; electromagnetic shielding; microwave application; nanotube polarization; polarized nanomaterial textile; shielding effectiveness; transmission waveguide; waveguide test bed; yarns; Carbon nanotubes; Conducting materials; Electromagnetic interference; Electromagnetic wave polarization; Electromagnetic waveguides; Microwave measurements; Nanotechnology; Organic materials; Textiles; Yarn; Carbon nanotube; polarization; shielding effectiveness;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location
Atlanta, GA
ISSN
0149-645X
Print_ISBN
978-1-4244-1780-3
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2008.4633084
Filename
4633084
Link To Document