Title :
Estimation of capacitance of small junction from liquid He temperature measurement
Author :
Iwasa, A. ; Fukushima, A. ; Sato, A. ; Sakamoto, Y.
Author_Institution :
Electrotech. Lab., Ibaraki, Japan
Abstract :
We show the way to estimate capacitance C and tunnel resistance R/sub T/ of a small junction from 4.2 K measurements using high temperature expansion for I-V curve. It enables us prompt feedback to fabricate the single electron tunneling elements.
Keywords :
capacitance measurement; low-temperature techniques; quantum interference phenomena; tunnelling; 4.2 K; I-V characteristics; capacitance; liquid helium temperature measurement; single electron tunneling element; small junction; tunnel resistance; Capacitance measurement; Current measurement; Curve fitting; Electrical resistance measurement; Electrons; Feedback; Helium; Tellurium; Temperature measurement; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.699874
