DocumentCode
2944772
Title
Vector near-field measurement system using an electro-optic microcavity and electrical downconversion
Author
Lee, Dong-Joon ; Kang, Jeong-Jin ; Chia-Chu Chen ; Whitaker, John F.
Author_Institution
Center for Ultrafast Optical Science and Department of Electrical Engineering and Computer Science, University of Michigan, 2200 Bonisteel Boulevard, Ann Arbor, 48109-2099, USA
fYear
2008
fDate
15-20 June 2008
Firstpage
1589
Lastpage
1592
Abstract
An electro-optic (EO) field-mapping system that features a continuous-wave laser-diode optical source, an entirely fiber-coupled beam path, a resonance-assisted EO-microcavity probe, and an RF-downconversion mixing circuit is shown to be effective for extracting near-field vector RF information. The system is the first of its kind to allow amplitude and phase analysis of signals interrogated with a continuous optical beam and no polarization components in the EO-modulation section. A complete tangential-electric-field characterization in the near field of an RFID antenna - a small planar loop intended for applications in mobile-reader instruments - is presented, with a >35 dB signal-to-noise ratio attained.
Keywords
electro-optical devices; measurement systems; mixers (circuits); semiconductor lasers; EO-modulation section; RF-downconversion mixing circuit; RFID antenna; amplitude analysis; complete tangential-electric-field characterization; continuous optical beam; continuous wave laser diode optical source; electrical downconversion; electrooptic field-mapping system; electrooptic microcavity; fiber-coupled beam path; mobile reader instruments; phase analysis; planar loop; polarization components; resonance-assisted EO-microcavity probe; vector near-field measurement system; Electric variables measurement; Electrooptic effects; Fiber lasers; Laser beams; Lasers and electrooptics; Microcavities; Optical beams; Optical fiber polarization; Optical mixing; Resonance; Dipole antennas; Fabry-Perot resonators; distributed feedback lasers; electrooptic measurements; electrooptic modulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location
Atlanta, GA
ISSN
0149-645X
Print_ISBN
978-1-4244-1780-3
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2008.4633087
Filename
4633087
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