Refractive index profiling of optical waveguides using near-field scanning optical microscopy

Author

Dhar, L. ; Lee, H.J. ; Laskowski, E.J. ; Buratto, S.K. ; Presby, H.M. ; Narayanan, C. ; Bahr, C.C. ; Anthony, P.J. ; Cardillo, M.J.

Author_Institution

AT&T Bell Labs., Murray Hill, NJ, USA

fYear

1996

fDate

25 Feb.-1 March 1996

Firstpage

303

Lastpage

304

Abstract

We present a method in which we take advantage of the high spatial resolution and experimental simplicity afforded by near-field scanning optical microscopy (NSOM) to determine the refractive index profiles of optical waveguides. We use NSOM to measure the near-field intensities of the guided modes in planar waveguides and optical fibers and calculate numerically, from the measured intensities, the refractive index distributions.

Keywords

optical microscopy; optical waveguides; refractive index; refractive index measurement; guided modes; near-field scanning optical microscopy; optical fibers; optical waveguides; planar waveguides; refractive index profiling; Apertures; Force measurement; Optical device fabrication; Optical microscopy; Optical refraction; Optical variables control; Optical waveguides; Refractive index; Spatial resolution; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Optical Fiber Communications, 1996. OFC '96

Print_ISBN

1-55752-422-X

Type

conf

DOI

10.1109/OFC.1996.908314

Filename

908314

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2944773