Title :
Stable multi-step capacitance control with binary voltage operation at +/-3V in integrated piezoelectric RF MEMS tunable capacitors
Author :
Nagano, T. ; Nishigaki, M. ; Kawakubo, T. ; Itaya, K.
Author_Institution :
Electron Devices Laboratory, Corporate R&D Center, Toshiba Corporation, Japan
Abstract :
The design and operation technique for a stable capacitance control in piezoelectric RF MEMS tunable capacitors have been investigated. Four folded-beam capacitors composed of piezoelectric aluminum nitride thin films were integrated in the quadruple capacitor and each folded-beam capacitor showed uniform operation voltage of less than 3V. A stable multi-step capacitance control was realized with the binary voltage operation at +/-3V, where each capacitor could be handled at binary state of capacitance due to its saturation characteristics. Eight levels of capacitance value up to 1.5pF with a step of 0.13pF to 0.16pF were realized.
Keywords :
Capacitors; Circuit optimization; Controllability; Parasitic capacitance; Piezoelectric devices; Radio frequency; Radiofrequency microelectromechanical systems; Tunable circuits and devices; Tuning; Voltage control; Q factor; RF MEMS; aluminum nitride; piezoelectric; tunable capacitor;
Conference_Titel :
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
978-1-4244-1780-3
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2008.4633094