• DocumentCode
    2945311
  • Title

    Temperature stability of magnetic-field-induced strain in NiMnGa intermartensitic phase

  • Author

    Kong, C. ; Yang, X. ; Cui, Y.

  • Author_Institution
    Chongqing Normal Univ., Chongqing
  • fYear
    2006
  • fDate
    8-12 May 2006
  • Firstpage
    674
  • Lastpage
    674
  • Abstract
    In this work the effect of temperature on giant magnetic-field-induced stain (MFIS) of a Ni52Mn24Ga24 single crystal, was quantified. A larger MFIS up to 1.2% was reported. A single crystal was grown in [001] direction of parent phase by a Czochralski method. A two-step annealed treatment (1073 K for 24 h and 773 K for 24 h) is adopted. A two-step thermally induced transition behavior in the Ni52Mn24Ga24 single crystal has been detected by ac magnetic susceptibility and electrical resistivity The resulted MFIS properties, such as saturated MFIS, saturated field, hysteresis effect and initial magnetic field have been discussed in detail.
  • Keywords
    annealing; crystal growth from melt; ferromagnetic materials; gallium alloys; magnetic field effects; magnetic hysteresis; magnetic susceptibility; magnetic transitions; magnetomechanical effects; manganese alloys; martensitic structure; martensitic transformations; nickel alloys; Czochralski method; MFIS; Ni52Mn24Ga24; [001] direction; [010] directions; [100] planes; ac magnetic susceptibility; electrical resistivity; ferromagnetic alloys; giant magnetic-field-induced stain; intermartensitic phase; magnetization measurements; martensite twin boundaries; single crystal; superconducting quantum interference device magnetometer; temperature 1073 K; temperature 773 K; thermally induced transition behavior; time 24 h; two-step annealed treatment; Annealing; Electric resistance; Magnetic field induced strain; Magnetic properties; Magnetic susceptibility; Saturation magnetization; Shape memory alloys; Stability; Temperature; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2006. INTERMAG 2006. IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-1479-2
  • Type

    conf

  • DOI
    10.1109/INTMAG.2006.376398
  • Filename
    4262107