Title :
Cryogenic current comparator measurements at 77 K using thallium-2223 thick-film shields
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
This paper describes resistance ratio measurements using cryogenic current comparator (CCC) devices that operate at 77 K. The magnetic shields are Thallium-based thick films on MgO substrates. The effectiveness of three shield geometries is determined using one-to-one and ten-to-one winding ratios.
Keywords :
cryogenic electronics; current comparators; electric resistance measurement; high-temperature superconductors; magnetic shielding; thallium compounds; thick films; 77 K; MgO substrate; Tl/sub 2/Ba/sub 2/Ca/sub 2/Cu/sub 3/O; cryogenic current comparator; magnetic shield; resistance ratio measurement; thallium-2223 thick film; winding ratio; Cryogenics; Current measurement; High temperature superconductors; Magnetic flux; Magnetic materials; Magnetic shielding; SQUIDs; Superconducting materials; Superconducting transition temperature; Thickness measurement;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.699878
