Title :
A smart accurate pressure-transducer for high-temperature applications [in oil wells]
Author :
de Jong, Paul C. ; Meijer, Gerard C M
Author_Institution :
Fac. of Electr. Eng., Delft Univ. of Technol., Netherlands
Abstract :
This paper describes a high-temperature pressure-transducer interface for resistive Wheatstone bridges. The long-term drift of the smart sensor, i.e., the (pressure) sensor plus its interface electronics, will be determined by the drift of the sensor element only. A three-signal auto-calibration sequence of the interface electronics keeps the transducer interface virtually free of long-term drift. A novel low-drift preamplifier forms an essential element in this system. The high-temperature operation of the transducer interface has been investigated from both an electronic and a packaging point of view. The system has been realized by combining CMOS ASICs with a thick-film packaging technology. The pressure-transducer interface works up to 250-275°C with 15-16 bits accuracy
Keywords :
CMOS analogue integrated circuits; application specific integrated circuits; bridge circuits; calibration; feedback amplifiers; high-temperature electronics; instrumentation amplifiers; integrated circuit packaging; intelligent sensors; lead bonding; oil technology; piezoresistive devices; preamplifiers; pressure transducers; signal processing equipment; thermal management (packaging); 250 to 275 C; ASIC packaging; CMOS ASIC; die bonding; dynamic feedback amplifier; high temperature electronics; high-temperature applications; interface electronics; long-term drift; low-drift preamplifier; oil well downhole pressure measurement; pressure-transducer interface; resistive Wheatstone bridges; smart accurate pressure-transducer; smart signal processor; thick-film packaging technology; three-signal auto-calibration sequence; wire bonding; Bridge circuits; CMOS technology; Electronics packaging; Intelligent sensors; Phase measurement; Pressure gauges; Space technology; Temperature sensors; Transducers; Voltage;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
Print_ISBN :
0-7803-5276-9
DOI :
10.1109/IMTC.1999.776767