• DocumentCode
    2945611
  • Title

    Characterization conduction properties of La1.4Sr1.6Mn2O7 by complex impedance spectroscopy

  • Author

    Hsu, C. ; Chou, H. ; Liao, B. ; Chen, W. ; Huang, J.

  • Author_Institution
    Nat. Cheng Kung Univ., Tainan
  • fYear
    2006
  • fDate
    8-12 May 2006
  • Firstpage
    688
  • Lastpage
    688
  • Abstract
    A La1.4Sr1.6Mn2O7 compound is fabricated in this study by standard solid state reaction method to determine its conduction properties by combining grain boundaries and intrinsic magnetoresistance. X-ray diffraction analysis and complex impedance measurements are used to characterize the obtained samples. The results show that the grain contribution is almost independent of the bias voltage and indicate that the two-phase grain boundary has a predominant effect on the AC electrical transport of the compound.
  • Keywords
    X-ray diffraction; electrical conductivity; grain boundaries; lanthanum compounds; magnetoresistance; strontium compounds; AC electrical transport; La1.4Sr1.6Mn2O7; X-ray diffraction; complex impedance measurements; complex impedance spectroscopy; conduction properties; grain boundaries; intrinsic magnetoresistance; solid state reaction method; Electrochemical impedance spectroscopy; Grain boundaries; Impedance measurement; Magnetic analysis; Magnetic properties; Magnetoresistance; Solid state circuits; Strontium; Voltage; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2006. INTERMAG 2006. IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-1479-2
  • Type

    conf

  • DOI
    10.1109/INTMAG.2006.376412
  • Filename
    4262121
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2945611