Switching Field Distribution of CoPtCr-SiO2 Perpendicular Recording Media Obtained by Subtracting Thermal Agitation of Magnetization

Author

Shimatsu, T. ; Kondo, T. ; Mitsuzuka, K. ; Watanabe, S. ; Aoi, H. ; Muraoka, H. ; Nakamura, Y.

Author_Institution

Tohoku Univ., Sendai

fYear

2006

fDate

8-12 May 2006

Firstpage

695

Lastpage

695

Abstract

The authors measured the remanent magnetization curves for a series of CoPtCr-SiO₂ perpendicular media with various thickness at low and high applied field sweep rates. They discussed the "intrinsic" switching field distribution (SFD) caused by the variations in the grain-to-grain switching field. Magnetic analysis revealed the values of the saturation magnetization and the uniaxial magnetic anisotropy energy. Results also suggest that there was no significant change in the microstructure with the thickness and concluded that there was a large thermal agitation effect on the SFD in the VSM time scale.

Keywords

chromium alloys; cobalt alloys; crystal microstructure; magnetic anisotropy; magnetic switching; perpendicular magnetic recording; platinum alloys; remanence; silicon compounds; CoPtCr-SiO₂; VSM time scale; grain-to-grain switching field; magnetic analysis; microstructure; perpendicular recording media; remanent magnetization; switching field distribution; thermal agitation; vibrating sample magnetometer; Communication switching; Grain size; Magnetic field measurement; Magnetic films; Magnetic switching; Magnetization; Perpendicular magnetic recording; Temperature; Thickness measurement; Time measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2006. INTERMAG 2006. IEEE International

Conference_Location

San Diego, CA

Print_ISBN

1-4244-1479-2

Type

conf

DOI

10.1109/INTMAG.2006.376419

Filename

4262128