Switching Field Distribution of CoPtCr-SiO2 Perpendicular Recording Media Obtained by Subtracting Thermal Agitation of Magnetization

The authors measured the remanent magnetization curves for a series of CoPtCr-SiO₂ perpendicular media with various thickness at low and high applied field sweep rates. They discussed the "intrinsic" switching field distribution (SFD) caused by the variations in the grain-to-grain switching field. Magnetic analysis revealed the values of the saturation magnetization and the uniaxial magnetic anisotropy energy. Results also suggest that there was no significant change in the microstructure with the thickness and concluded that there was a large thermal agitation effect on the SFD in the VSM time scale.