• DocumentCode
    2945796
  • Title

    Effects of post-annealing on magnetic properties and microstructure of CoCrPt-SiO2 perpendicular magnetic recording media

  • Author

    Park, S. ; Kim, S. ; Oh, H. ; Kim, Y. ; Hong, D. ; Lee, T.

  • Author_Institution
    Korea Adv. Inst. of Sci. & Technol., Daejeon
  • fYear
    2006
  • fDate
    8-12 May 2006
  • Firstpage
    697
  • Lastpage
    697
  • Abstract
    In this work, the effects of post-annealing of CoCrPt-SiO2/Ru perpendicular magnetic recording media on magnetic properties and microstructure have been studied. CoCrPt-SiO2/Ru/Ta thin films were deposited on Si substrate by a dc magnetron sputtering method at room temperature and followed by post-annealing for 30 minutes in the range of 100 ~ 240degC. Magnetic properties such as magnetization, coercivity (Hc) and negative nucleation field (Hn) were measured by a vibrating sample magnetometer. Magnetic anisotropic constant (Ku) of the films was measured by a torque magnetometer. Microstructural and chemical changes were studied.
  • Keywords
    annealing; chromium alloys; cobalt alloys; coercive force; crystal microstructure; magnetic anisotropy; magnetic thin films; magnetisation; nucleation; perpendicular magnetic recording; platinum alloys; ruthenium; silicon alloys; sputter deposition; tantalum; thin films; CoCrPt-SiO2; Si; coercivity; magnetic anisotropic constant; magnetic properties; magnetization; magnetron sputtering; microstructure; negative nucleation field; perpendicular magnetic recording media; post-annealing; silicon substrate; temperature 100 degC to 240 degC; temperature 293 K to 298 K; thin films; time 30 min; torque magnetometer; vibrating sample magnetometer; Magnetic anisotropy; Magnetic field measurement; Magnetic properties; Magnetometers; Microstructure; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Semiconductor thin films; Sputtering; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2006. INTERMAG 2006. IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-1479-2
  • Type

    conf

  • DOI
    10.1109/INTMAG.2006.376421
  • Filename
    4262130