DocumentCode
2945852
Title
Effect of Ar pressure on switching field distribution of CoPtCr-SiO2 perpendicular media
Author
Vokoun, D. ; Lai, C. ; Lin, M. ; Jiang, R.
Author_Institution
Nat. Tsing-hua Univ., Hsinchu
fYear
2006
fDate
8-12 May 2006
Firstpage
700
Lastpage
700
Abstract
In the present study, the switching field distribution (SFD) of the Tb/Pt/Ru/CoPtCr-SiO2 perpendicular media has been studied in relation to the Ar pressure at which the recording layer was deposited. The goal of the present study is to correlate the SFDs of the Tb/Pt/Ru/CoPtCr-SiO2 media with their intergranular exchange coupling and their grain size distribution.
Keywords
chromium alloys; cobalt alloys; grain size; magnetic switching; perpendicular magnetic anisotropy; perpendicular magnetic recording; platinum; platinum alloys; ruthenium; silicon compounds; terbium; SFD; Tb-Pt-Ru-CoPtCr-SiO2 - Interface; grain size distribution; intergranular exchange coupling; recording layer; switching field distribution; Amorphous magnetic materials; Amorphous materials; Anisotropic magnetoresistance; Argon; Demagnetization; Grain size; Materials science and technology; Neodymium; Saturation magnetization; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location
San Diego, CA
Print_ISBN
1-4244-1479-2
Type
conf
DOI
10.1109/INTMAG.2006.376424
Filename
4262133
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