• DocumentCode
    2946058
  • Title

    Dual-band VCO using composite right/left-handed transmission line and tunable negative resistance based on pin diode

  • Author

    Choi, Jaewon ; Seo, Chulhun

  • Author_Institution
    School of Electronic Engineering, Soongsil University, Sangdo-dong, Dongjak-ku, Seoul 156-743 Korea
  • fYear
    2008
  • fDate
    15-20 June 2008
  • Firstpage
    241
  • Lastpage
    244
  • Abstract
    In this paper, the dual-band voltage-controlled oscillator (VCO) using the composite right/left-handed (CRLH) transmission line (TL) and the tunable negative resistance based on the pin diode is presented. It is demonstrated that the CRLH TL can lead to metamaterial transmission line with the dual-band tuning. The dual-band of the CRLH TL is achieved by the frequency offset and the phase slope of the CRLH TL. The tunable negative resistance based on the pin diode has been used to operate the dual-band of VCO. The phase noise of VCO is -108.34 ~ -106.67 dBc/Hz @ 100 kHz in the tuning range, 2.423 ~ 2.597 GHz for the forward bias of the pin diode, whereas that of VCO is -114.16 ~ -113.33 dBc/Hz @ 100 kHz in the tuning range, 5.137 ~ 5.354 GHz for the reverse bias of the pin diode.
  • Keywords
    metamaterials; p-i-n diodes; phase noise; transmission lines; voltage-controlled oscillators; composite right/left-handed transmission line; dual-band tuning; dual-band voltage-controlled oscillator; frequency 100 kHz; frequency 2.597 GHz to 2.423 GHz; frequency 5.354 GHz to 5.137 GHz; metamaterial transmission line; phase noise; pin diode; reverse bias; tunable negative resistance; Capacitance; Dual band; Frequency; Inductance; Metamaterials; Power transmission lines; Shunt (electrical); Transmission lines; Tuning; Voltage-controlled oscillators; Dual-band VCO; composite right/left-handed transmission line; metamaterial; phase noise; tunable negative resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2008 IEEE MTT-S International
  • Conference_Location
    Atlanta, GA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-1780-3
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2008.4633148
  • Filename
    4633148