Perpendicular Media Overcoat Coverage Challenge

Author

Dai, Q. ; Takano, K. ; Wang, G. ; Brinkman, E. ; Waltman, R. ; Nayak, V. ; Yen, B.K.

Author_Institution

Hitachi GST, San Jose

fYear

2006

fDate

8-12 May 2006

Firstpage

717

Lastpage

717

Abstract

The perpendicular media investigated employed silicon oxide in the recording layer to facilitate grain segregation, as reported. Overcoat used for these studies includes sputtered CNx, SiNx and ion beam carbon. Method for corrosion assessment includes (1) ICP-MS measurement of extractable Co, (2) Electrochemical polarization curve, and (3) Temperature and Relative Humidity (T&RH) condensation test. Roughness-induced challenges on subsequent post processing steps is reported. Because PMR media is reported to have high surface roughness, our first study has been designed to quantify overcoat coverage limit and compare that with longitudinal media.

Keywords

carbon compounds; corrosion; electrochemistry; grain boundary segregation; perpendicular magnetic recording; protective coatings; silicon compounds; sputtered coatings; surface roughness; SiO₂; amorphous grain boundaries; corrosion; electrochemical polarization curve; overcoat coverage challenge; perpendicular recording; segregated grains; silicon oxide; surface roughness; Burnishing; Cobalt; Corrosion; Humidity; Ion beams; Perpendicular magnetic recording; Polarization; Protection; Rough surfaces; Surface roughness;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2006. INTERMAG 2006. IEEE International

Conference_Location

San Diego, CA

Print_ISBN

1-4244-1479-2

Type

conf

DOI

10.1109/INTMAG.2006.376441

Filename

4262150