Title :
Dynamic Lorentz Microscopy of Magnetization Reversal in Magnetic Tunnel Junctions
Author :
Shaw, J.M. ; Geiss, R. ; Pappas, D. ; Russek, S.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder
Abstract :
This paper investigates the use of extended Lorentz microscopy to study the real-time magnetic behavior of magnetic tunnel junctions (MTJs). The formation of a "fur tree" ripple structure prior to the free layer undergoes a magnetic reversal is identified. The quality of the magnetic structure and magnetization reversal process were found to be highly dependant on processing conditions and MTJ layer thickness. Finally, small magnetization fluctuations which are known to be large sources of noise in MTJ devices are observed.
Keywords :
fluctuations; magnetic noise; magnetic structure; magnetic tunnelling; magnetisation reversal; extended Lorentz microscopy; fur tree ripple structure; magnetic structure; magnetic tunnel junctions; magnetization fluctuations; magnetization reversal; noise; Annealing; Atomic force microscopy; Fluctuations; Magnetic devices; Magnetic domain walls; Magnetic domains; Magnetic force microscopy; Magnetic tunneling; Magnetization reversal; Saturation magnetization;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.376452
