DocumentCode :
2946381
Title :
Partial discharges as a recognition tool of defects in all-film capacitor models
Author :
Hammal, R. ; Rain, P. ; Gosse, J.P. ; Hantouche, C.
Author_Institution :
Lab. d´´Electrostatique et de Mater. Dielectriques, CNRS, Grenoble, France
Volume :
2
fYear :
1997
fDate :
19-22, Oct 1997
Firstpage :
494
Abstract :
Artificial defects simulating manufacture vices have been intentionally introduced in an all-film capacitor model (for example, poor impregnation, floating contact). The partial discharges (pd) induced therein under AC stress were recorded and studied as a function of time and voltage. The partial discharge inception voltage, the evolution with time of both discharge frequency and apparent charge and the shape of phase distributions of the apparent charge and discharge number are the main parameters which relate each pd recording to its cause
Keywords :
capacitors; composite insulating materials; electron device testing; flaw detection; partial discharges; polymer films; power capacitors; 0 to 12 kV; 50 Hz; AC stress; Faraday cage; PDIV; all-film capacitor models; apparent charge; artificial defects; defect recognition tool; discharge frequency; floating contact; manufacture vices; partial discharge inception voltage; partial discharges; phase distribution shape; polypropylene films; poor impregnation; time dependence; voltage dependence; Capacitors; Density estimation robust algorithm; Dielectrics; Electrodes; Insulation testing; Partial discharges; Rain; Shape; Stress; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1997. IEEE 1997 Annual Report., Conference on
Conference_Location :
Minneapolis, MN
Print_ISBN :
0-7803-3851-0
Type :
conf
DOI :
10.1109/CEIDP.1997.641119
Filename :
641119
Link To Document :
بازگشت