• DocumentCode
    2946780
  • Title

    New electrical modeling approach for simultaneous switching noise for high-performance packages

  • Author

    Kato, Katsuto ; Miura, Masayuki ; Ito, Kenji ; Yamaji, Yasuhiro ; Sudo, Toshio

  • Author_Institution
    Semicond. Device Eng. Lab., Toshiba Corp., Kawasaki, Japan
  • fYear
    1996
  • fDate
    28-31 May 1996
  • Firstpage
    739
  • Lastpage
    746
  • Abstract
    Efficient package modeling is required-to predict a package electrical performance such as simultaneous switching noise (SSN) at an early design stage for high-performance packages. This Paper describes a new modeling approach for SSN applicable to various package structures. The efficient and synthetic modeling approach which we call “segment model” was constructed on the basis of the ratio of signal-to-power/ground counts for both the inner leads and outer leads. To verify the validity of the segment model, SSN induced in ceramic land grid array (C-LGA) with a socket was measured by an LSI tester and the result was compared with simulation data
  • Keywords
    inductance; integrated circuit modelling; integrated circuit noise; integrated circuit packaging; integrated circuit testing; ceramic land grid array; electrical modeling; high-performance packages; package modeling; segment model; simultaneous switching noise; Bonding; Current distribution; Electromagnetic modeling; Electronics packaging; Power system modeling; Power transmission lines; Predictive models; Semiconductor device noise; Semiconductor device packaging; Sockets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1996. Proceedings., 46th
  • Conference_Location
    Orlando, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3286-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1996.550489
  • Filename
    550489