• DocumentCode
    2946821
  • Title

    Relaxing non-volatility for fast and energy-efficient STT-RAM caches

  • Author

    Smullen, Clinton W. ; Mohan, Vidyabhushan ; Nigam, Anurag ; Gurumurthi, Sudhanva ; Stan, Mircea R.

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Virginia, Charlottesville, VA, USA
  • fYear
    2011
  • fDate
    12-16 Feb. 2011
  • Firstpage
    50
  • Lastpage
    61
  • Abstract
    Spin-Transfer Torque RAM (STT-RAM) is an emerging non-volatile memory technology that is a potential universal memory that could replace SRAM in processor caches. This paper presents a novel approach for redesigning STT-RAM memory cells to reduce the high dynamic energy and slow write latencies. We lower the retention time by reducing the planar area of the cell, thereby reducing the write current, which we then use with CACTI to design caches and memories. We simulate quad-core processor designs using a combination of SRAM- and STT-RAM-based caches. Since ultra-low retention STT-RAM may lose data, we also provide a preliminary evaluation for a simple, DRAM-style refresh policy. We found that a pure STT-RAM cache hierarchy provides the best energy efficiency, though a hybrid design of SRAM-based L1 caches with reduced-retention STT-RAM L2 and L3 caches eliminates performance loss while still reducing the energy-delay product by more than 70%.
  • Keywords
    cache storage; logic design; multiprocessing systems; random-access storage; CACTI; DRAM style refresh policy; SRAM based L1 caches; STT-RAM L2 caches; STT-RAM L3 caches; STT-RAM memory cell redesigning; energy delay product; energy efficiency; nonvolatile memory technology; processor cache; quadcore processor design; spin transfer torque RAM; ultralow retention time; universal memory; write latencies; Integrated circuit modeling; Magnetic tunneling; Nonvolatile memory; Random access memory; Switches; Temperature; Thermal stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Performance Computer Architecture (HPCA), 2011 IEEE 17th International Symposium on
  • Conference_Location
    San Antonio, TX
  • ISSN
    1530-0897
  • Print_ISBN
    978-1-4244-9432-3
  • Type

    conf

  • DOI
    10.1109/HPCA.2011.5749716
  • Filename
    5749716