• DocumentCode
    2946861
  • Title

    The development of microwave power amplifiers and nonlinear measurement systems - is the measurement systems manufacturer still lead by the PA designer?

  • Author

    Mikkelsen, Jan H. ; Tafuri, Felice F. ; Nielsen, Troels S. ; Ming Shen ; Wei Wei ; Jensen, Ole K.

  • Author_Institution
    Dept. of Electron. Syst., Aalborg Univ., Aalborg, Denmark
  • fYear
    2013
  • fDate
    26-28 Nov. 2013
  • Firstpage
    339
  • Lastpage
    344
  • Abstract
    Developments within modern nonlinear measurement systems offer an increasing degree of flexibility to the microwave power amplifier (PA) designer. The PA designer has historically been a driving factor in setting the development directions of new measurement systems, fueling the paradigm, that PA innovations largely push new measurement requirements. It would appear that measurement system manufacturers are now the ones pushing the technology envelope. This paper discusses current trends within modern nonlinear measurement systems to determine who is leading whom and whether the aforementioned paradigm is shifting.
  • Keywords
    measurement systems; microwave power amplifiers; PA designer; measurement system manufacturers; microwave power amplifier designer; modern nonlinear measurement systems; technology envelope; GSM; Integrated circuit modeling; Load modeling; Peak to average power ratio; Radio frequency; Scattering parameters; Topology; measurement technology; modeling; power amplifiers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Telecommunications Forum (TELFOR), 2013 21st
  • Conference_Location
    Belgrade
  • Print_ISBN
    978-1-4799-1419-7
  • Type

    conf

  • DOI
    10.1109/TELFOR.2013.6716239
  • Filename
    6716239