• DocumentCode
    2946938
  • Title

    Three-dimensional intra-wall characterization with linear inverse scattering algorithm

  • Author

    Zhang, Wenji ; Hoorfar, Ahmad ; Thajudeen, Christopher

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Villanova Univ., Villanova, PA, USA
  • fYear
    2011
  • fDate
    3-8 July 2011
  • Firstpage
    3066
  • Lastpage
    3069
  • Abstract
    In this paper, the three-dimensional (3D) intra-wall inspection is cast as a subsurface imaging problem. The region between the front and back boundaries of the wall is imaged using a novel linear inverse scattering algorithm for 3D subsurface imaging. The imaging algorithm is based on first order Born approximation and exploits the halfspace Green´s function. The exploding source model is employed and then the Green´s function is expanded in the spectrum domain to formulate the 3D intra-wall imaging algorithm. The linearization of the inversion scheme and the employment of FFT/IFFT in the imaging formula make the imaging algorithm suitable for several applications pertaining to the diagnostics of large probed domain and allow real-time processing. A numerical result is presented to show the effectiveness and efficiency of the proposed linear inverse scattering algorithm for 3D intra-wall characterization.
  • Keywords
    Green´s function methods; approximation theory; electromagnetic wave scattering; fast Fourier transforms; image processing; inverse transforms; 3D intrawall imaging algorithm; 3D subsurface imaging; FFT-IFFT; first order Born approximation; halfspace Green´s function; linear inverse scattering algorithm; three-dimensional intrawall characterization; Algorithm design and analysis; Approximation algorithms; Imaging; Inverse problems; Radar imaging; Real time systems; Three dimensional displays; intra-wall characterization; linear inverse scattering; subsurface imaging; three-dimensional imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation (APSURSI), 2011 IEEE International Symposium on
  • Conference_Location
    Spokane, WA
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4244-9562-7
  • Type

    conf

  • DOI
    10.1109/APS.2011.5997178
  • Filename
    5997178