Title :
Modeling of losses in substrate integrated waveguide by Boundary Integral-Resonant Mode Expansion method
Author :
Bozzi, Maurizio ; Perregrini, Luca ; Wu, Ke
Author_Institution :
University of Pavia, Department of Electronics, Italy
Abstract :
This paper presents an efficient technique for the evaluation of different types of losses in substrate integrated waveguide (SIW). This technique is based on the Boundary Integral-Resonant Mode Expansion (BI-RME) method in conjunction with a perturbation approach. This method also permits to derive automatically multimodal and parametric equivalent circuit models of SIW discontinuities, which can be adopted for an efficient design of complex SIW circuits. Moreover, a comparison of losses in different types of planar interconnects (SIW, microstrip, coplanar waveguide) is presented.
Keywords :
coplanar waveguides; equivalent circuits; integrated circuit interconnections; integrated circuit modelling; microwave integrated circuits; perturbation theory; substrate integrated waveguides; SIW planar interconnects; boundary integral-resonant mode expansion method; coplanar waveguide interconnects; equivalent circuit modeling; microstrip planar interconnects; multimodal equivalent circuit model; parametric equivalent circuit model; perturbation method; planar circuit technology; substrate integrated waveguide; waveguide losses; Conductivity; Coplanar waveguides; Dielectric losses; Equivalent circuits; Integrated circuit interconnections; Integrated circuit technology; Permittivity; Planar waveguides; Rectangular waveguides; Waveguide components; Equivalent circuit modeling; planar circuit technology; substrate integrated waveguide; waveguide losses;
Conference_Titel :
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-1780-3
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2008.4633216
