Detecting voids in glass-bead devices with partial discharges induced by external fields

Author

Wetzer, J.M.

Author_Institution

High Voltage & EMC Group, Eindhoven Univ. of Technol., Netherlands

Volume

2

fYear

1997

fDate

19-22, Oct 1997

Firstpage

521

Abstract

This paper presents a study on the feasibility of void detection in mm-sized glass-bead medium voltage devices with partial discharges induced by external fields. Based on an evaluation of the field required for discharge inception and the attainable sensitivity it is concluded that voids with sizes in the range of 10-100 μm can be detected provided that the setup is compact and well-shielded, and uses a cylindrical geometry with the test-object immersed in an insulating fluid with a high dielectric constant

Keywords

flaw detection; glass; insulating materials; insulator testing; partial discharges; voids (solid); 10 to 100 mum; cylindrical geometry; cylindrical glass insulator; discharge inception; external fields; glass-bead medium voltage devices; high dielectric constant; insulating fluid; partial discharges; sensitivity; void detection; void size; Conductors; Dielectric devices; Dielectric liquids; Dielectrics and electrical insulation; Equations; Geometry; Glass; Low voltage; Medium voltage; Partial discharges;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena, 1997. IEEE 1997 Annual Report., Conference on

Conference_Location

Minneapolis, MN

Print_ISBN

0-7803-3851-0

Type

conf

DOI

10.1109/CEIDP.1997.641125

Filename

641125