• DocumentCode
    2947665
  • Title

    A rigorous solution to the low-frequency breakdown in the electric field integral equation

  • Author

    Zhu, Jianfang ; Omar, Saad ; Chai, Wenwen ; Jiao, Dan

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2011
  • fDate
    3-8 July 2011
  • Firstpage
    3214
  • Lastpage
    3217
  • Abstract
    The low-frequency breakdown problem in electric field integral equation (EFIE) is well recognized and has been extensively studied. However, existing approaches have not rigorously solved the problem yet since they rely on low-frequency approximations. In this work, we present a rigorous method to fundamentally eliminate the problem. In this method, the original frequency dependent problem is rigorously transformed to a generalized eigenvalue problem, from the solution of which the frequency dependence of the EFIE solution can be analytically derived. The rigor of the proposed method has been validated at frequencies as low as DC. As the first rigorous solution to EFIE at low frequencies, the proposed method can be used to benchmark the accuracy of existing low-frequency EFIE-based solvers, quantitatively answer critical design questions such as at which frequency full-wave effects become important, etc.
  • Keywords
    approximation theory; eigenvalues and eigenfunctions; electric breakdown; electromagnetic fields; frequency-domain analysis; integral equations; EFIE; electric field integral equation; frequency dependent problem; generalized eigenvalue problem; low-frequency approximations; low-frequency breakdown; Antennas; Approximation methods; Eigenvalues and eigenfunctions; Electric breakdown; Frequency dependence; Integral equations; Maxwell equations; Electric field integral equation (EFIE); electromagnetic analysis; full-wave analysis; low frequency breakdown;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation (APSURSI), 2011 IEEE International Symposium on
  • Conference_Location
    Spokane, WA
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4244-9562-7
  • Type

    conf

  • DOI
    10.1109/APS.2011.5997218
  • Filename
    5997218