DocumentCode
2947828
Title
The influence of surface properties of plasma-etched polydimethylsiloxane (PDMS) on cell growth and morphology
Author
Pennisi, Cristian P. ; Zachar, Vladimir ; Gurevich, Leonid ; Patriciu, Andrei ; Struijk, Johannes J.
Author_Institution
Dept. of Health Sci. & Technol., Aalborg Univ., Aalborg, Denmark
fYear
2010
fDate
Aug. 31 2010-Sept. 4 2010
Firstpage
3804
Lastpage
3807
Abstract
Polydimethylsiloxane (PDMS) or silicone rubber is a widely used implant material. Approaches to promote tissue integration to PDMS are desirable to avoid clinical problems associated with sliding and friction between tissue and implant. Plasma-etching is a useful way to control cell behavior on PDMS without additional coatings. In this work, different plasma processing conditions were used to modify the surface properties of PDMS substrates. Surface nanotopography and wettability were measured to study their effect on in vitro growth and morphology of fibroblasts. While fluorinated plasma treatments produced nanorough hydrophobic and superhydrophobic surfaces that had negative or little influences on cellular behavior, water vapor/oxygen plasma produced smooth hydrophillic surfaces that enhanced cell growth.
Keywords
biological tissues; biomedical materials; cellular biophysics; etching; hydrophilicity; hydrophobicity; plasma materials processing; polymers; prosthetics; surface roughness; wetting; PDMS; cell growth; cell morphology; fibroblasts; friction; implant material; nanorough hydrophobic surfaces; plasma etching; plasma processing; polydimethylsiloxane; sliding; smooth hydrophillic surfaces; superhydrophobic surfaces; surface nanotopography; surface properties; tissue integration; wettability; Implants; Plasmas; Rough surfaces; Surface morphology; Surface roughness; Surface topography; Surface treatment; Cell Division; Cells, Cultured; Dimethylpolysiloxanes; Humans; Microscopy, Atomic Force; Surface Properties; Wettability;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location
Buenos Aires
ISSN
1557-170X
Print_ISBN
978-1-4244-4123-5
Type
conf
DOI
10.1109/IEMBS.2010.5627602
Filename
5627602
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