• DocumentCode
    2947905
  • Title

    Comparing pulse-height and pulse-shape analysis of partial discharge signals

  • Author

    Contin, A. ; Montanari, G.C.

  • Author_Institution
    Dipt. di Elettrotecnica Elettronica ed Inf., Trieste Univ., Italy
  • Volume
    2
  • fYear
    1997
  • fDate
    19-22, Oct 1997
  • Firstpage
    526
  • Abstract
    This paper has the purpose to provide a first contribution to the investigation of the perspectives offered by partial-discharge (PD) pulse-shape recording systems in insulation diagnosis and quality control. In particular, the capability to provide a stochastic inference having accuracy levels comparable with those achievable by PD-pulse height and phase analyzers is inferred. This result is obtained varying typical set-up parameters for the two types of measuring systems, that is, dead time, gain and low-level discriminator. The behaviour of the two systems is compared resorting to the estimates of the scale and shape parameters of the Weibull distributions of pulse-charge height recorded from corona and surface discharges
  • Keywords
    Weibull distribution; corona; flaw detection; insulation testing; partial discharges; pulse height analysers; pulse shaping circuits; quality control; stochastic processes; surface discharges; Weibull distributions; accuracy levels; corona; dead time; defect detection; gain; insulation diagnosis; insulation quality control; low-level discriminator; measuring systems; partial discharge signals; pulse-charge height; pulse-height analysis; pulse-shape analysis; stochastic inference; surface discharges; Corona; Gain measurement; Insulation; Partial discharges; Pulse shaping methods; Quality control; Shape; Stochastic processes; Time measurement; Weibull distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1997. IEEE 1997 Annual Report., Conference on
  • Conference_Location
    Minneapolis, MN
  • Print_ISBN
    0-7803-3851-0
  • Type

    conf

  • DOI
    10.1109/CEIDP.1997.641127
  • Filename
    641127