Title :
Enhanced prediction of multipaction breakdown in passive waveguide components including space charge effects
Author :
Anza, S. ; Vicente, C. ; Raboso, D. ; Gil, J. ; Gimeno, B. ; Boria, V.E.
Author_Institution :
AURORA Software and Testing S.L., Parc CientÃ\xadfic Universitat de Valÿncia, PolÃ\xadgono ¿La Coma¿ s/n, 46980 Paterna, Spain
Abstract :
An enhanced prediction software tool of multipaction breakdown effect in passive waveguide components is proposed in this work. For such purpose, the space charge field effects are included employing a particle-in-cell code and finite differences in time domain integration techniques. As a result, the novel prediction tool models all the physical effects derived from multipactor such as reflected power, noise and/or harmonics, thus improving the accuracy of the threshold predictions and providing very valuable additional information of the phenomena. Such tool has been integrated within a full-wave modal analysis software for complex waveguide geometries (FEST3D), and the multipactor effect has been accurately predicted for two practical waveguide filter structures. The results provided by our tool have been successfully compared with data from standard multipactor susceptibility curves and experimental measurements.
Keywords :
finite difference time-domain analysis; modal analysis; passive networks; waveguide filters; complex waveguide geometries; finite difference method; full-wave modal analysis software; multipaction breakdown prediction; particle-in-cell code; passive waveguide components; space charge field effects; time domain integration techniques; waveguide filter structures; Electric breakdown; Finite difference methods; Geometry; Modal analysis; Power harmonic filters; Power system harmonics; Predictive models; Software tools; Space charge; Waveguide components; Vacuum breakdown; electromagnetic fields; microwave devices; passive filters; rectangular waveguides; space charge;
Conference_Titel :
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-1780-3
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2008.4633247