Title :
Thermal Stability in Textured CoFe/IrMn Films with Os Buffer and Barrier Layer
Author :
Peng, T. ; Lo, C. ; Chen, S. ; Yao, Y.
Author_Institution :
Nat. Chiao Tung Univ., Hsinchu
Abstract :
In this paper, the characteristics of the osmium (Os) in textured CoFe/IrMn magnetic film multilayer structure system is investigated and the characteristics of buffer layer and diffusion barrier is also reported. To examine the magnetic behavior, magneto-optical Kerr effect (MOKE) and vibrating sample magnetometer (VSM) are used and XRD is used to examine the crystal structure. As a result, a textured Ta/CoFe/Os(d)/IrMn is successfully grown on Os(0002)/Cu(002) seed layer by MMES method and at high temperature Os barrier stabilizes the CoFe/IrMn. Also, the exchange field is shown to vary with annealing temperature and Os thickness, and, no exchange bias is observed with dges1 nm.
Keywords :
Kerr magneto-optical effect; X-ray diffraction; annealing; buffer layers; cobalt alloys; copper; crystal structure; diffusion barriers; exchange interactions (electron); iridium alloys; iron alloys; magnetic epitaxial layers; magnetic multilayers; manganese alloys; osmium; silicon; sputtered coatings; sputtering; tantalum; texture; thermal stability; CoFe-IrMn; Cu-Si; MMES method; Os; Ta; X-ray diffraction; XRD; annealing temperature; buffer layer; crystal structure; diffusion barrier; exchange field; magnetic property; magneto-optical Kerr effect; magnetron sputtering; metal-metal epitaxy; seed layer; textured magnetic film multilayer structure; thermal stability; vibrating sample magnetometer; Annealing; Buffer layers; Kerr effect; Magnetic films; Magnetic multilayers; Magnetometers; Magnetooptic effects; Temperature; Thermal stability; X-ray scattering;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.374854
