• DocumentCode
    2948080
  • Title

    Systematic waveform engineering enabling high efficiency modes of operation in Si LDMOS at both L-band and S-band frequencies

  • Author

    Sheikh, Aamir ; Roff, Chris ; Benedikt, J. ; Tasker, P.J. ; Noori, B. ; Aaen, P. ; Wood, J.

  • Author_Institution
    School of Engineering, Cardiff University, CF23 3AA, U.K.
  • fYear
    2008
  • fDate
    15-20 June 2008
  • Firstpage
    1143
  • Lastpage
    1146
  • Abstract
    This paper demonstrates that by robust waveform engineering it is possible for high power Si LDMOS to achieve very high efficiency at frequencies up to 2.1 GHz. Class F amplifier operation was realized in a 5 W LDMOS device by the successful application of robust waveform engineering procedures; undertaken at the current generator plane. The peak power added efficiency was found to be 78% at 0.9 GHz and 77% at 2.1 GHz. In both cases the RF waveforms were optimized in terms of the gate voltage, fundamental and harmonic impedances. The main difference at 2.1 GHz was the change in fundamental impedance to a more reactive impedance to compensate for the dynamic device output capacitance. To the authorspsila knowledge this is the highest efficiencies reported in the literature for Si LDMOS devices at 2.1 GHz.
  • Keywords
    MOS analogue integrated circuits; UHF integrated circuits; UHF power amplifiers; elemental semiconductors; silicon; L-band frequency; S-band frequency; Si; class F amplifier operation; current generator plane; dynamic device output capacitance; frequency 0.9 GHz; frequency 2.1 GHz; high power LDMOS; peak power added efficiency; power 5 W; reactive impedance; systematic waveform engineering; Capacitance; Impedance; L-band; Operational amplifiers; Power engineering and energy; Radio frequency; Radiofrequency amplifiers; Robustness; Systems engineering and theory; Voltage; Power amplifiers; class F; high efficiency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2008 IEEE MTT-S International
  • Conference_Location
    Atlanta, GA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-1780-3
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2008.4633259
  • Filename
    4633259