The Structure and Magnetic Properties of CoNbZr-Sm2O3 Granular Films

Author

Jung, W. ; Lee, C. ; Koo, B. ; Shin, K. ; Yoo, J. ; Shimada, Y.

Author_Institution

Changwon Univ., Changwon

fYear

2006

fDate

8-12 May 2006

Firstpage

839

Lastpage

839

Abstract

In this study, granular films were prepared by reactive RF magnetron sputtering. The film was deposited on Si (100) substrates. The magnetic properties (coercivity) were measured by a vibrating sample magnetometer (VSM). The electrical resistivity (p) of the thin film was determined by means of a four-point probe method. The film structures were investigated by X-ray diffractometry (XRD) and transmission electron microscopy (TEM).

Keywords

X-ray diffraction; cobalt alloys; coercive force; electrical resistivity; granular materials; granular structure; magnetic thin films; magnetometers; niobium alloys; samarium compounds; sputter deposition; transmission electron microscopy; zirconium alloys; CoNbZr-Sm₂O₃; Si; Si (100) substrates; TEM; X-ray diffractometry; XRD; electrical resistivity; four-point probe method; granular thin film structure; magnetic properties; reactive RF magnetron sputtering; transmission electron microscopy; vibrating sample magnetometer; Coercive force; Electric resistance; Magnetic films; Magnetic properties; Magnetometers; Radio frequency; Semiconductor films; Sputtering; Substrates; Vibration measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2006. INTERMAG 2006. IEEE International

Conference_Location

San Diego, CA

Print_ISBN

1-4244-1479-2

Type

conf

DOI

10.1109/INTMAG.2006.374870

Filename

4262272