• DocumentCode
    2948395
  • Title

    Ultra-fast imaging of pulsed-field surface-flashover along an alumina dielectric in vacuum

  • Author

    Coaker, B.M. ; Xu, N.S. ; Bower, S. ; Latham, R.V.

  • Author_Institution
    Pulse Switching & Pulse Protection Product Group, EEV Ltd., Lincoln, UK
  • Volume
    2
  • fYear
    1995
  • fDate
    3-6 July 1995
  • Firstpage
    911
  • Abstract
    Pulsed-field surface-flashover events have been studied for a regime based on a cylindrical alumina insulator (94% Al/sub 2/O/sub 3/), having two concentric planar electrodes on its end-face. Voltage-pulses, typically of 20 kV amplitude (500 kV /spl mu/s/sup -1/ time rate-of-rise), were applied to the radial insulator-electrodes M-I-M regime. Real-time optical recordings of surface-flashover events were made using an ultra high-speed framing camera, with temporal resolutions of up to 5 /spl mu/s per frame; A high spatial resolution (586/spl times/385 pixels) facilitated the detailed recording of optical-emission phenomena associated with the surface-flashover of the alumina. The initiation of surface-flashover in the alumina dielectric is discussed in terms of explosive electron-emission from localised defect-centres within the ceramic.
  • Keywords
    alumina; cameras; electric breakdown; flashover; high-speed optical techniques; impulse testing; insulator testing; surface discharges; 20 kV; 5 mus; Al/sub 2/O/sub 3/; alumina dielectric; concentric planar electrodes; cylindrical alumina insulator; explosive electron-emission; localised defect-centres; optical-emission phenomena; pulsed field surface flashover; real-time optical recordings; temporal resolution; ultra high-speed framing camera; ultra-fast imaging; Cameras; Dielectrics; Electrodes; Explosives; High speed optical techniques; Insulation; Optical imaging; Optical recording; Spatial resolution; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 1995. Digest of Technical Papers., Tenth IEEE International
  • Conference_Location
    Albuquerque, NM, USA
  • Print_ISBN
    0-7803-2791-8
  • Type

    conf

  • DOI
    10.1109/PPC.1995.599728
  • Filename
    599728