Title :
Modeling and measurements of parasitic parameters for integrated power electronics modules
Author :
Chen, Jonah Zhou ; Yang, Liyu ; Boroyevich, Dushan ; Odendaal, Willem Gerhardus
Author_Institution :
Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
In this paper, the parasitic inductance and capacitance of integrated power electronics modules (IPEMs) were modeled using Maxwell Q3D extractor. The IPEMs were then measured using impedance analyzer. A set of impedance curves was obtained under different measurement conditions, such as different DC bias voltages. Together with the device model, the Maxwell Q3D extractor results were simulated in Saber to get the impedance curves, which were compared with impedance measurement results. The comparison showed good agreement between simulation and measurement results.
Keywords :
Maxwell equations; capacitance measurement; electric impedance measurement; inductance measurement; power integrated circuits; DC bias voltages; IPEM; Maxwell Q3D extractor; impedance analyzer; impedance curves; impedance measurement; integrated power electronics modules; parasitic capacitance; parasitic inductance; parasitic parameters measurement; Circuit simulation; Computational modeling; Impedance measurement; Inductance; Packaging; Parasitic capacitance; Power electronics; Power measurement; Power system modeling; Wire;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2004. APEC '04. Nineteenth Annual IEEE
Print_ISBN :
0-7803-8269-2
DOI :
10.1109/APEC.2004.1295857
