Title :
Low Frequency Noise in CoFeB/MgO(100)/CoFeB Magnetic Tunnel Junctions
Author :
Nor, A. F Md ; Daibou, T. ; Oogane, M. ; Ando, Y. ; Miyazaki, T.
Author_Institution :
Univ. of Tohoku, Sendai
Abstract :
This work reports on low frequency noise measurements performed on CoFeB/MgO(100)/CoFeB magnetic tunnel junctions. The voltage annealing effect was done on sample that was exposed to 4 mA current continuously for up to 100 hours. Noise power spectral density as a function of easy axis bias field for 5 nm thick CoFeB shows additional noise at antiparallel state in bottom-top and top-bottom current directions. The increase in noise was due to rotation of free layer that induces magnetostriction which was then shown in the 1/f noise.
Keywords :
1/f noise; annealing; boron alloys; cobalt alloys; ferromagnetic materials; iron alloys; magnesium compounds; magnetic noise; magnetic tunnelling; magnetostriction; 1/f noise; CoFePt-MgO-CoFePt; antiparallel state; bottom-top current directions; current 4 mA; easy axis bias field; low frequency noise measurements; magnetic tunnel junctions; magnetostriction; noise power spectral density; time 100 hour; top-bottom current directions; voltage annealing effect; Annealing; Frequency measurement; Low-frequency noise; Magnetic field measurement; Magnetic noise; Magnetic tunneling; Magnetostriction; Noise measurement; Performance evaluation; Voltage;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.374889
