DocumentCode
2948887
Title
A Ballistic Electron Emission Microscopy (BEEM) Study of Metallic Multilayers
Author
Thompson, J. ; Zhang, T. ; Shen, T. ; Hopkinson, M.
Author_Institution
Univ. of Salford, Salford
fYear
2006
fDate
8-12 May 2006
Firstpage
876
Lastpage
876
Abstract
The hot electron transport properties of bilayer and trilayer structures of the form Au/Fe/Au/GaAs (001) and Au/Fe/GaAs (001) using ballistic electron emission microscopy (BEEM) are studied.
Keywords
III-V semiconductors; field emission electron microscopy; gallium arsenide; gold; hot carriers; iron; multilayers; Au-Fe-Au-GaAs - Interface; Au-Fe-GaAs - Interface; GaAs; ballistic electron emission microscopy; bilayer structure; hot electron transport properties; metallic multilayers; trilayer structure; Electron emission; Electron microscopy; Gallium arsenide; Giant magnetoresistance; Gold; III-V semiconductor materials; Iron; Magnetoelectronics; Nonhomogeneous media; Spin valves;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location
San Diego, CA
Print_ISBN
1-4244-1479-2
Type
conf
DOI
10.1109/INTMAG.2006.374907
Filename
4262309
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